发明名称 Integrated CMOS circuit, e.g. for DRAM, logic
摘要 The CMOS circuit has a substrate (1) with monocrystalline silicon adjacent at least one surface, covered by a dielectric layer (2), with an insulation structure (6) adjacent the surface, for relative insulation of neighbouring MOS transistors having oppositely doped gate electrodes. The lower part (12,16) of at least one of the latter gate electrodes is partially enclosed by the insulation structure, with a diffusion barrier (19) within the gate electrode, the upper part (17) of which is coupled to the gate electrode of at least one further MOS transistor.
申请公布号 DE19750340(A1) 申请公布日期 1999.06.02
申请号 DE19971050340 申请日期 1997.11.13
申请人 SIEMENS AG, 80333 MUENCHEN, DE 发明人 SCHWALKE, UDO, DR., 84431 HELDENSTEIN, DE
分类号 H01L21/762;H01L21/8238;H01L27/092;(IPC1-7):H01L27/092;H01L21/823 主分类号 H01L21/762
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