发明名称
摘要 PURPOSE:To provide a manufacturing method of a semiconductor device wherein the deterioration of the refresh time of a dynamic random access memory can be prevented regarding the improvement of the manufacturing method of the semiconductor device wherein the deterioration of the refresh time is prevented. CONSTITUTION:The manufacture is constituted so as to include a process wherein impurities having a concentration which can stabilize the refresh time are implanted into the surface of a semiconductor substrate 1 inside a contact hole 6a made in a silicon oxide film 6 formed on the surface of the semiconductor substrate 1.
申请公布号 JP2900717(B2) 申请公布日期 1999.06.02
申请号 JP19920213121 申请日期 1992.08.11
申请人 FUJITSU KK 发明人 TANAKA IZUMI;SAITO HITOSHI
分类号 H01L27/04;H01L21/822;H01L21/8242;H01L27/10;H01L27/108 主分类号 H01L27/04
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