发明名称 Methods and apparatus for testing analog-to-digital and digital-to-analog device using digital testers
摘要 Methods and apparatus for coupling a digital tester to a mixed-signal device under test. In exemplary embodiments, a digital tester interface communicates with a digital tester and a device under test, and performs analog-to-digital and digital-to-analog translations between the digital tester and the device under test, so that delays associated with prior art testing systems are significantly reduced. The digital tester interface of the present invention is properly viewed as a hardware accelerator enabling quick and cost effective quality-testing of mixed-signal devices using inexpensive digital testers. Because the digital tester interface reduces per-function test time by an order of magnitude as compared to prior art systems, mixed-signal devices are more thoroughly tested and quality assurance levels are maximized at minimal additional cost. Furthermore, because analog-to-digital and digital-to-analog conversions are performed external to a digital tester, performance calculations are carried out at a much higher resolution as compared to prior art systems.
申请公布号 US5909186(A) 申请公布日期 1999.06.01
申请号 US19970886252 申请日期 1997.07.01
申请人 VLSI TECHNOLOGY GMBH 发明人 GOEHRINGER, REINER
分类号 G01R31/319;H03M1/10;H03M1/12;H03M1/66;(IPC1-7):H03M1/10 主分类号 G01R31/319
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