发明名称 Electronic device for testing bonding wire integrity
摘要 A device presenting pairs of split contact pad portions, each pair of pads having multiple bonding wire, and metal connecting strips associated therewith. The end portion of the metal connecting strips being split into parallel strip segments, each connected to a respective contact pad, so as to form a plurality of parallel current paths between a node and an external contact pin connected to the node. When current is supplied along the connecting strip a voltage drop along each segment connected to a sound bonding wire is produced, but not along the segments connected to broken or non-bonded wires. By determining the existence of a voltage difference between the contact pad portions, it is possible to detect the interruption of one or more of the bonding wires.
申请公布号 US5909034(A) 申请公布日期 1999.06.01
申请号 US19960648990 申请日期 1996.05.17
申请人 SGS-THOMSON MICRORLECTRONICS S.R.L. 发明人 SOLDAVINI, FRANCESCO CHRAPPAN;SALINA, ALBERTO
分类号 G01R31/02;H01L21/60;H01L21/66;H01L21/822;H01L23/482;H01L23/528;H01L27/04;(IPC1-7):H01L23/49 主分类号 G01R31/02
代理机构 代理人
主权项
地址