发明名称 CIRCUIT FOR DETECTING BREAKDOWN
摘要 PROBLEM TO BE SOLVED: To provide a circuit for detecting breakdown wherein, even when two capacitors formed on a substrate are gradually broken down, the capacitor that is broken down is discriminated for inspection. SOLUTION: Related to a breakdown detecting circuit wherein breakdown of first and second capacitors C1 and C2 formed on a substrate is detected, a first diode D1 is connected to the first capacitor C1, a second diode D2 is connected to the second capacitor C2 in a phase reverse to the first diode D1, the first capacitor and diode C1 and D1, and the second capacitor and diode C2 and D2 are connected in parallel to an AC power source 3 through a resistor R3, and a voltmeter 5 is connected to the resistor R3.
申请公布号 JPH11145016(A) 申请公布日期 1999.05.28
申请号 JP19970301798 申请日期 1997.11.04
申请人 SONY CORP 发明人 YAMAGUCHI TSUTOMU
分类号 G01M99/00;H01G13/00;H01L21/66 主分类号 G01M99/00
代理机构 代理人
主权项
地址