| 摘要 |
PROBLEM TO BE SOLVED: To provide a micro-lens inspecting device in which the inspection of micro-lenses is improved. SOLUTION: A parallel light incidence means 11 makes parallel light L2 incident on a micro-lens 12. An inspection processing means 14 captures transmitted light L3 transmitted through the micro-lens 12, discriminates only a specific part with a significant difference from other parts of the micro-lens from the measured values of the transmitted light L3, and determines it as failure. |
