METHOD FOR DISCRIMINATING FAILURE SEMICONDUCTOR DEVICE,申请号JP19970308995-传众专利搜索

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发明名称	METHOD FOR DISCRIMINATING FAILURE SEMICONDUCTOR DEVICE
摘要
申请公布号	JPH11145018(A)	申请公布日期	1999.05.28
申请号	JP19970308995	申请日期	1997.11.11
申请人	SONY CORP	发明人	ATAISHI HIROYUKI
分类号	H01L21/66;H01L21/02;(IPC1-7):H01L21/02	主分类号	H01L21/66
代理机构		代理人
主权项
地址

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