SEMICONDUCTOR INTEGRATED CIRCUIT, OPERATING STATUS DETECTOR, AND ELECTRONIC EQUIPMENT

摘要

A semiconductor integrated circuit in which functional blocks having different operating frequencies are provided and the MOS transistors respectively constituting the functional blocks have different thresholds from block to block. In the first to N-th functional blocks (30-1 to 30-N) to which constant voltages (VC1-VCN) generated from a constant-voltage generating section (20) are supplied as power supply voltages, an operating status detector (40) detects the variation of the operating speed and the abilities of the transistors as a voltage value (Vvfre). An operating status encoding section (50) encodes the voltage value (Vvfre) and a voltage output control section (60) changes the constant voltages (VC1-VCN) supplied to the functional blocks (30-1 to 30-N) by changing the reference voltages (VB1-VBN) of the constant-voltage generating section (20).