发明名称 |
PROCESS OF IDENTIFICATION OF X-RAY REFLEXES ON HEMISPHERICAL SURFACE |
摘要 |
FIELD: X-ray and diffractometric studies. SUBSTANCE: high accuracy of determination of coordinates of X-ray reflex is achieved due to recording of spatial distribution of X-ray quanta with continuous anode-resistive layer of discrete collection of information by linear-coordinate detector. Reduced time of exposure for collection of needed set of information is obtained thanks to simultaneous recording of quanta of diffracted X-ray radiation practically for all crystallographic densities appeared to be under Bragg law. EFFECT: provision for high accuracy of determination of coordinates of X-ray reflexes, reduced time of exposure during X-ray and diffractometric studies. 1 dwg
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申请公布号 |
RU2131134(C1) |
申请公布日期 |
1999.05.27 |
申请号 |
RU19960109488 |
申请日期 |
1996.05.07 |
申请人 |
VOJSKOVAJA CHAST' 75360 |
发明人 |
LJUTTSAU A.V.;KOTELKIN A.V.;ZVONKOV A.D.;MATVEEV D.B.;MAKLASHEVSKIJ V.JA. |
分类号 |
G01T1/02;(IPC1-7):G01T1/02 |
主分类号 |
G01T1/02 |
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