发明名称 One- or two-dimensional surface waviness measurement of shiny material
摘要 The process comprises illuminating the surface with a light source, having a spatially dependent density with at least one light-dark passage, recording reflected light from the surface with a camera which is focused on the surface, and digitally evaluating the camera signal. The light-dark passage of the light source may comprise a large contrast, whereby the blind of the camera is opened wide, or a soft contrast, whereby the blind is largely closed.
申请公布号 DE19751399(A1) 申请公布日期 1999.05.27
申请号 DE19971051399 申请日期 1997.11.20
申请人 HAUCK, RICHARD, DR., 46569 HUENXE, DE 发明人 HAUCK, RICHARD, DR., 46569 HUENXE, DE;KOHUS, PETER, DR., 85570 MARKT SCHWABEN, DE
分类号 G01B11/30;(IPC1-7):G01B11/30 主分类号 G01B11/30
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