发明名称 CMP POLISHING PAD AND POLISHING DEVICE USING IT
摘要 PROBLEM TO BE SOLVED: To provide a CMP polishing pad which is not affected by dissolution and corrosion due to polishing agent. SOLUTION: A CMP polishing pad 10 mainly contains A and B components, including bisphenol A epoxy resin, novolak epoxy resin, bisphenol F epoxy resin, or these polymer and these deformed epoxy resin, aromatic amines, aromatic acid anhydride, imidazols, or these polymer and these deformed hardening agent, the surface hardness being 2.5-40 at a Vickers hardness.
申请公布号 JPH11138420(A) 申请公布日期 1999.05.25
申请号 JP19970305884 申请日期 1997.11.07
申请人 NIKON CORP 发明人 ISHIKAWA AKIRA
分类号 B24B37/20;B24B37/24;H01L21/304 主分类号 B24B37/20
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