发明名称 CMP POLISHING PAD AND POLISHING DEVICE USING IT
摘要 PROBLEM TO BE SOLVED: To provide a polishing pad which has the optimum hardness corresponding to the hardness of a polished object, without reducing the property of the polishing pad, and a polishing device using it. SOLUTION: A CMP polishig pad 10 mainly contains A and B components, including bisphenol A epoxy resin, novolak epoxy resin, bisphenol F epoxy resin, or these polymer and these deformed epoxy resin, aromatic amines, aromatic acid anhyddride, imidazols, or these polymer and these deformed hardening agent, monoepoxide, polyepoxide, polythiol, polyole, polycarboxyl compound, urethane prepolymer, and flexible granting agent of block urethane prepolymer, the surface hardness being 2.5-40 at a Vickers hardness.
申请公布号 JPH11138421(A) 申请公布日期 1999.05.25
申请号 JP19970305885 申请日期 1997.11.07
申请人 NIKON CORP 发明人 ISHIKAWA AKIRA
分类号 B24B37/20;B24B37/24;H01L21/304 主分类号 B24B37/20
代理机构 代理人
主权项
地址