发明名称 Composition and method for formation of silica thin films
摘要 <p>The claimed invention pertains to a composition that forms silica thin films, wherein said composition performs well as a planarizing coating when applied to a substrate and is subsequently converted by exposure to high-energy radiation. The resultant silica thin films have excellent electrical insulating performance. Said composition comprises (A) a hydrogen silsesquioxane resin that contains at least 45 weight % of a hydrogen silsesquioxane resin with a molecular weight no greater than 1,500; and (B) solvent. A silica thin film is produced by evaporating the solvent (B), and then converting at least a portion of the hydrogen silsesquioxane resin (A) to silica by exposing coated substrate to high-energy radiation. The preferred substrate is a semiconductor substrate having at least one electrically conductive layer.</p>
申请公布号 SG65053(A1) 申请公布日期 1999.05.25
申请号 SG19980000386 申请日期 1998.02.21
申请人 DOW CORNING TORAY SILICONE COMPANY, LIMITED. 发明人 KOBAYASHI AKIHIKO;MINE KATSUTISHI;NAKAMURA TAKASHI;SASAKI MOTOSHI;SAWA KIYOTAKA
分类号 C08G77/12;C09D183/04;H01L21/316;(IPC1-7):C08G77/12;H01L21/312 主分类号 C08G77/12
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