| 摘要 |
PROBLEM TO BE SOLVED: To test a redundancy memory cell array before substitution without increasing a circuit scale even if a number of redundancy memory cell arrays are provided. SOLUTION: Even if a fuse element 29 is not cut off by a redundancy memory cell array before substitution, a test signal 10 is low-leveled to turn off a MOS transistor 35. Then a MOS transistor 34 is turned off and a decoding signal 105a is high-leveled to test the redundancy memory cell array. Therefore, the function of the redundancy memory cell array can be tested before the substitution. |
