发明名称 |
PROJECTION EXPOSURE DEVICE, PROJECTION EXPOSURE METHOD, AND METHOD OF MANUFACTURING PROJECTION EXPOSURE DEVICE |
摘要 |
An exposure device with a higher resolution, comprising a light source (1), an illumination optical system (3) for illuminating a pattern on a projection reticle (R) by a light beam from the light source (1), and a projection optical system (4) for projecting the image of the pattern on a photosensitive surface on a photosensitive wafer (W), wherein the light source (1) supplies light whose wavelength is shorter than 193 nm, a band narrowing device (2) which narrows the bandwidth of the spectrum of the light supplied by the light source (1), is provided, and the projection optical system includes a plurality of refractive optical devices all made of CaF2.
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申请公布号 |
WO9925008(A1) |
申请公布日期 |
1999.05.20 |
申请号 |
WO1998JP04999 |
申请日期 |
1998.11.06 |
申请人 |
NIKON CORPORATION;SUZUKI, KENJI;MORI, TAKASHI |
发明人 |
SUZUKI, KENJI;MORI, TAKASHI |
分类号 |
G03F7/20;(IPC1-7):H01L21/027 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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