发明名称 PROJECTION EXPOSURE DEVICE, PROJECTION EXPOSURE METHOD, AND METHOD OF MANUFACTURING PROJECTION EXPOSURE DEVICE
摘要 An exposure device with a higher resolution, comprising a light source (1), an illumination optical system (3) for illuminating a pattern on a projection reticle (R) by a light beam from the light source (1), and a projection optical system (4) for projecting the image of the pattern on a photosensitive surface on a photosensitive wafer (W), wherein the light source (1) supplies light whose wavelength is shorter than 193 nm, a band narrowing device (2) which narrows the bandwidth of the spectrum of the light supplied by the light source (1), is provided, and the projection optical system includes a plurality of refractive optical devices all made of CaF2.
申请公布号 WO9925008(A1) 申请公布日期 1999.05.20
申请号 WO1998JP04999 申请日期 1998.11.06
申请人 NIKON CORPORATION;SUZUKI, KENJI;MORI, TAKASHI 发明人 SUZUKI, KENJI;MORI, TAKASHI
分类号 G03F7/20;(IPC1-7):H01L21/027 主分类号 G03F7/20
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