发明名称 A fabrication method for semiconductor devices
摘要 <p>A fabrication method for semiconductor devices connecting a multi-crystal semiconductor thin film and a semiconductor region including a high density of an impurity formed in a single crystal semiconductor substrate. After forming a N-type semiconductor region as the emitter by ion implanting, for instance, as into a P-type semiconductor region as the base, a polysilicon thin film 114 is deposited so as to be implanted with As ions and then heat treated. In this case, an amorphous portion of the N-type semiconductor region and an amorphous silicon thin film in contact therewith are transformed by solid phase epitaxial growth so as to form a single crystal semiconductor region, a single-crystalline silicon thin film, and a polysilicon thin film, thus forming a bipolar element having an emitter. <IMAGE></p>
申请公布号 EP0466195(B1) 申请公布日期 1999.05.19
申请号 EP19910111743 申请日期 1991.07.15
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 KAMEYAMA, SHUICHI;HORI, ATSUSHI;SHIMOMURA, HIROSHI;SEGAWA, MIZUKI
分类号 H01L21/20;H01L21/265;H01L21/285;H01L21/331;(IPC1-7):H01L21/331 主分类号 H01L21/20
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