发明名称 |
Etching of platinum film to form electrode |
摘要 |
Platinum is etched using a mask with high selectivity relative to platinum and an etchant gas having a high platinum/mask etching ratio. A platinum etching process comprises: (i) depositing a platinum layer on an insulator; (ii) depositing a masking layer with high selectivity relative to platinum on the platinum layer; (iii) structuring the masking layer to provide a predetermined aperture spacing; and (iv) injecting an etchant gas, having a platinum/masking layer etching ratio of more than 2, for etching the platinum layer. An Independent claim is also included for a similar process in which an adhesion layer is initially deposited on the insulator and is subsequently etched using the masking layer and the etched platinum layer as masks.
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申请公布号 |
DE19852256(A1) |
申请公布日期 |
1999.05.20 |
申请号 |
DE19981052256 |
申请日期 |
1998.11.12 |
申请人 |
LG SEMICON CO., LTD., CHEONGJU, KR |
发明人 |
LEE, JUN SIK, CHEONGJU, KR |
分类号 |
H01L21/306;C23F4/00;H01L21/02;H01L21/302;H01L21/3065;H01L21/3213;(IPC1-7):C23F1/02;C23F1/12;H01L21/321 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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