发明名称 Etching of platinum film to form electrode
摘要 Platinum is etched using a mask with high selectivity relative to platinum and an etchant gas having a high platinum/mask etching ratio. A platinum etching process comprises: (i) depositing a platinum layer on an insulator; (ii) depositing a masking layer with high selectivity relative to platinum on the platinum layer; (iii) structuring the masking layer to provide a predetermined aperture spacing; and (iv) injecting an etchant gas, having a platinum/masking layer etching ratio of more than 2, for etching the platinum layer. An Independent claim is also included for a similar process in which an adhesion layer is initially deposited on the insulator and is subsequently etched using the masking layer and the etched platinum layer as masks.
申请公布号 DE19852256(A1) 申请公布日期 1999.05.20
申请号 DE19981052256 申请日期 1998.11.12
申请人 LG SEMICON CO., LTD., CHEONGJU, KR 发明人 LEE, JUN SIK, CHEONGJU, KR
分类号 H01L21/306;C23F4/00;H01L21/02;H01L21/302;H01L21/3065;H01L21/3213;(IPC1-7):C23F1/02;C23F1/12;H01L21/321 主分类号 H01L21/306
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