发明名称 |
X-ray examination apparatus with a semiconductor x-ray detector |
摘要 |
An x-ray examination apparatus includes an x-ray source for emitting x-rays and an x-ray detector for deriving an image signal from an x-ray image. The x-ray detector has a semiconductor element including one or several sensor elements. Further the x-ray examination apparatus is provided with a bias radiation source for irradiating the x-ray detector with electromagnetic radiation. In particular, the x-ray detector is an x-ray sensor matrix having a multitude of semiconductor sensor elements. Preferably the bias radiation source is arranged to emit infrared radiation.
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申请公布号 |
US5905772(A) |
申请公布日期 |
1999.05.18 |
申请号 |
US19970889273 |
申请日期 |
1997.07.08 |
申请人 |
U.S. PHILIPS CORPORATION |
发明人 |
RUTTEN, WALTER;SCHIEBEL, ULRICH;WIECZOREK, HERFRIED;CONRADS, NORBERT |
分类号 |
G01N23/04;A61B6/00;G01T1/20;G01T1/24;H01J31/50;H04N3/32;H04N5/32;H04N5/325;H05G1/64;(IPC1-7):H04N5/00 |
主分类号 |
G01N23/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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