发明名称 Method of making SRAM cell having single layer polysilicon thin film transistors
摘要 A static metal oxide semiconductor random access memory (SRAM) having NMOS and thin film transistors (TFTs) formed from a single polysilicon layer, and a method for forming the same. The SRAM cell comprises a plurality of NMOS transistors and TFTs that are interconnected by a local interconnect structure. The single layer of poly is used to define the TFT bodies and gates of NMOS transistors in the SRAM cell. Each TFT comprises a single polysilicon layer comprising source gate and drain regions. During the fabrication process, exposed portions of the TFT polysilicon body and exposed regions of NMOS transistors react with a refractory metal silicide to form polycide and silicide regions, respectively. An amorphous silicon pattern also reacts with the refractory metal silicide to form a local interconnect structure connecting the silicided portions of the thin film transistors and the MOS transistors. This arrangement results in a TFT SRAM cell that can be implemented using simple fabrication techniques, such as single poly logic processes or ASIC processes.
申请公布号 US5904512(A) 申请公布日期 1999.05.18
申请号 US19970895364 申请日期 1997.07.16
申请人 ADVANCED MICRO DEVICES, INC. 发明人 CHANG, KUANG-YEH;LIU, YOWJUANG W.
分类号 H01L21/768;H01L21/8244;H01L21/84;H01L27/11;H01L27/12;(IPC1-7):H01L21/824 主分类号 H01L21/768
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