发明名称 Method of manufacturing a thin film transistor using anodic oxidation
摘要 In a source/drain doping step in manufacturing a field effect transistor, particularly a thin-film transistor (TFT), high-speed boron ions are implanted in a state that an active layer in which to form the source and drain is covered with an insulating film, whereas phosphorus ions are implanted in a state that the surface of the active layer is exposed.
申请公布号 US5904509(A) 申请公布日期 1999.05.18
申请号 US19940367427 申请日期 1994.12.30
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 ZHANG, HONGYONG;OHNUMA, HIDETO;TAKEMURA, YASUHIKO
分类号 H01L21/8238;H01L21/265;H01L21/28;H01L21/336;H01L21/77;H01L21/84;H01L27/092;H01L27/12;H01L29/78;H01L29/786;(IPC1-7):H01L21/336 主分类号 H01L21/8238
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