| 摘要 |
In order to accelerate the short circuit and component test phase while testing electrical modules in a flying probe tester comprising contact elements that can move in all directions on the module to be tested to produce electrical contacts to the contact points pertaining to the corresponding supply systems of the electrical modules, the invention provides that contact of said groups of contact points (i.e. P1, P2; P3, P4) be made at the beginning of the test phase so that a supply line-ground/potential connection can be made with respect to all supply systems (i.e. RN1, RN2) on the electrical modules to be tested with the purpose of conducting the corresponding measurements. |
