Method and circuit for regulating the length of an ATD pulse signal

摘要

The invention relates to a method and a circuit for regulating a pulse synchronization signal (ATD) for the memory cell read phase in semiconductor integrated electronic memory devices. The pulse signal (ATD) is generated upon detection of a change in logic state of at least one of a plurality of address input terminals of the memory cells, so as to also generate an equalization signal (SAEQ) to a sense amplifier. The SAEQ pulse is blocked (STOP) upon the row voltage reaching a predetermined sufficient value to provide reliable reading. Advantageously, the pulse blocking is produced by a logic signal (STOP) activated upon a predetermined voltage value being exceeded during the overboost phase of the addressed memory row. <IMAGE>