A method for generating test patterns for use with a scan circuit,申请号EP19920118252-传众专利搜索

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发明名称	A method for generating test patterns for use with a scan circuit
摘要
申请公布号	EP0540967(B1)	申请公布日期	1999.05.12
申请号	EP19920118252	申请日期	1992.10.26
申请人	FUJITSU LIMITED	发明人	NAKATA, TSUNEO
分类号	G01R31/3183;G06F11/22;(IPC1-7):G06F11/26	主分类号	G01R31/3183
代理机构		代理人
主权项
地址

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