发明名称 METHOD FOR FORMING THIN TUNNELING WINDOWS IN EEPROMs
摘要 <p>A method for making submicron dielectric windows for electron tunneling between a floating gate and substrate in a semiconductor EEPROM device. A mask edge overlying an oxide layer on a substrate is undercut a small distance, the area surrounding that small distance is built up with oxide, then a thin layer of oxide is formed in the undercut distance to serve as a tunneling window.</p>
申请公布号 EP0664051(B1) 申请公布日期 1999.05.12
申请号 EP19940922441 申请日期 1994.06.17
申请人 ATMEL CORPORATION 发明人 LARSEN, BRADLEY, J.;ERICKSON, DONALD, A.
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/31 主分类号 H01L21/8247
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