A method and apparatus for scan testing of electrical circuits,申请号EP19970308297-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	A method and apparatus for scan testing of electrical circuits
摘要
申请公布号	EP0837336(A3)	申请公布日期	1999.05.12
申请号	EP19970308297	申请日期	1997.10.20
申请人	TEXAS INSTRUMENTS INC.	发明人	WHETSEL, LEE D.
分类号	G01R31/28;G01R31/3183;G01R31/3185;G06F11/22;(IPC1-7):G01R31/318	主分类号	G01R31/28
代理机构		代理人
主权项
地址

您可能感兴趣的专利

CAPACITOR STRUCTURE OF SEMICONDUCTOR DEVICE AND ITSFABRICATION METHOD

POWER RESET AND MANUAL RESET IDENTIFICATION CIRCUITAND METHOD

PROCEDIMENTO PER DETERMINARE LE GRANDEZZE CHE CARATTERIZZANO IL COMPORTAMENTO DI UN VEICOLO DURANTE LA MARCIA.

Spindle and toolholder for machine tool

Honeycomb structural material

Coupling for heavy-duty machine

Device for displaying remaining charge of secondary cell

Free space optical communication system

Voice recognition apparatus and method

Method and system for assembling a wall

Apparatus for automatic initiation of data transmission

Rotary gas injector

Lightning protection system

Protective goggle

Biologically active agent having immunomodulating properties,method for its obtaining and pharmaceutical preparation based on it

Rotating electric shaver with two heads

Polycyclosiloxanes and thermally reversible living silicone rubbers

Low temperature regeneration of coke deactivated reforming catalysts