发明名称 Verfahren und Anlage zur Herstellung von Halbleitervorrichtungen
摘要 A wafer(s) for producing semiconductor devices is subjected to heat treatment in a vertical thermal reactor, which is provided with an electric heating means (15) setting a first temperature and another electric heating means (15) setting a second temperature higher than the first temperature. The wafer(s) (2) is moved upwards and is subected to a treatment in the second region of the vertical thermal reactor (4); and, is reverted to the first region. Rapid thermal processing of 6 or 8 inch wafer(s) is possbile without causing slip lines. <IMAGE>
申请公布号 DE69228787(D1) 申请公布日期 1999.05.06
申请号 DE1992628787 申请日期 1992.10.23
申请人 F.T.L. CO., LTD., KAWASAKI, KANAGAWA, JP 发明人 TAKAGI, MIKIO, KAWASAKI-SHI, KANAGAWA, JP
分类号 C23C16/46;C23C16/54;C30B31/12;F27B17/00;F27D3/00;H01L21/00;(IPC1-7):C23C16/54 主分类号 C23C16/46
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