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发明名称
Verfahren und Vorrichtung zum Prüfen wabenförmiger Objekte mit mehreren Durchgangslöchern
摘要
申请公布号
DE69414297(T2)
申请公布日期
1999.05.06
申请号
DE19946014297T
申请日期
1994.03.29
申请人
NGK INSULATORS, LTD., NAGOYA, AICHI, JP
发明人
OHNISHI, TAKAO, NIWA-GUN, AICHI-PREF 456, JP;OSUGI, YUKIHISA, NAGOYA-CITY, AICHI-PREF 456, JP;MUTO, MIYUKI, OBU-CITY, AICHI-PREF 474, JP
分类号
G01N21/956;(IPC1-7):G01N21/88
主分类号
G01N21/956
代理机构
代理人
主权项
地址
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