| 摘要 |
The invention provides a simulation method and apparatus for a semiconductor integrated circuit which can perform simulation of an operation characteristic of each of a plurality of circuit blocks of a semiconductor integrated circuit and simulation of simultaneous operation characteristics when a plurality of ones of the circuit blocks operate simultaneously and allows evaluation of counter-electromotive forces or the like which may cause a malfunction due to mutual intervention of the circuit blocks after the semiconductor integrated circuit is manufactured as a product. The simulation apparatus comprises a first simulation section for executing simulation of an operation characteristic for each circuit block, a first determination section for determining a result of the simulation, a library in which data regarding mutual intervention which occurs when a plurality of ones of the circuit blocks operate simultaneously are stored, a second simulation section for executing simulation of simultaneous operation characteristics using the data of mutual intervention stored in the library, and a second determination section for determining a result of the simulation of the second simulation section.
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