首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
IMPACT TESTER OF COMBINED COIN
摘要
申请公布号
KR160162(B1)
申请公布日期
1999.05.01
申请号
KR19940036320
申请日期
1994.12.23
申请人
KOREA SECURITY PRINTING & MINTING CORP.
发明人
KIM, JAE-DUK;CHOE, JONG-HWA;LEE, WUK-HYUNG
分类号
G01N3/30;(IPC1-7):G01N3/30
主分类号
G01N3/30
代理机构
代理人
主权项
地址
您可能感兴趣的专利
MANUFACTURE OF MOS CONTROL TYPE POWER SEMICONDUCTOR
IMAGE DISPLAY DEVICE AND MOVING IMAGE RETRIEVAL SYSTEM
Intraluminal graft
Intravascular stent and method
High performance microprocessor using instructions that operate within instruction groups
CONTROL METHOD FOR BROADCASTING SEND-OUT SYSTEM
PROGRAM TRANSMITTER
DOUBLE-OUTPUT LOW NOISE DOWN CONVERTER CIRCUIT
Modular mirrored cache memory battery backup system
Standby current detecting circuit for use in a semiconductor memory device and method thereof
Lamination of apertured or non-apertured three-dimensional films to apertured or non-apertured three-dimensional and/or flat films
Transfer case with selectively grounded member
SYSTEM AND METHOD FOR PROVIDING INFORMATION
METHOD FOR FINDING PROBABILISTIC MOTIF OF ARRAY OF PROTEIN AND GENE
Aparelho distribuidor de materiais de enxugamento
Method for reducing syruping in refrigerated doughs
Novel methods for the characterization of compounds which stimulate STF-1 expression in pancreatic islet cells.
Processo de introduzir de maneira confiável e previsível resistência a nematódeo de cisto em germoplasma de soja nao resistente e local de peculiaridade quantitativa
Batarya kolu montajı
MANUFACTURE OF SEMICONDUCTOR DEVICE