发明名称 WAFER SUPPORT
摘要 <p>PROBLEM TO BE SOLVED: To prolong life by suppressing the generation of large thermal stresses in a wafer support being used, when processing a wafer while rotating it at a high temperature. SOLUTION: An inner-periphery side part 11 has an opening part at a center, and a wafer 10 is accommodated in an opening part 14. An outer-periphery side part 12 has an opening part at a center, and the inner-periphery side part 11 is supported in the opening part. A sectional shape that is vertical with respect to the planar thickness direction of the opening part of the outer- periphery side part 12 has a shape, in which circumference is divided equally into four parts and a straight line is inserted into the divided parts. Furthermore, the shape of the section of the planar thickness direction of the opening part of the outer-periphery side part 12 is formed, so that it has a linear inclination and the diameter of the opening part which gradually becomes smaller from the upper surface side toward the lower surface side of the outer-periphery side part 12. The section of the outer-periphery part of the inner-periphery side part 11 has the same shape as the sectional shape of the opening of the outer-periphery side part 12.</p>
申请公布号 JPH11121597(A) 申请公布日期 1999.04.30
申请号 JP19970286733 申请日期 1997.10.20
申请人 TOSHIBA MACH CO LTD 发明人 SHIMADA MASAYUKI
分类号 B23Q3/00;C23C16/44;C23C16/458;H01L21/68;H01L21/683;(IPC1-7):H01L21/68 主分类号 B23Q3/00
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