| 摘要 |
PROBLEM TO BE SOLVED: To specify a faulty LSI from among a plurality of LSIs without performing manual analysis. SOLUTION: A faulty LSI diagnostic device 1 has a scan process control means 11 controlling a scan process and detecting whether or not a fault is present on a scan path, an indicating information setting means 121 setting faulty LSI indicating information, '0' or '1', for the front flip-flop of all of LSIs on the scan path via a read data line 3, and indicating the process of re-scanning a device 2 for diagnosis to the scan process control means 11, and an indicating information counting means 122 counting the number of pieces of '0' or '1' faulty LSI indicating information which are output from the scan path as the result of the re-scanning process. By imparting the numbers of LSIs in order of LSI 0, LSI 1, and so on from the scan-out side of the device 2 for diagnosis, the value counted by the indicating information counting means 122 is matched with the number of the faulty LSI. |
