发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURE
摘要 PROBLEM TO BE SOLVED: To form a surface protection film of an InP/InGaAs hetero junction bipolar transistor with good reproducibility, by using a lamination film consisting of an InP layer and an InGaAsP layer as a surface protection film. SOLUTION: A lamination film consisting of an InP layer 4 and an InGaAsP layer 5 is used as a surface protection film and a guard ring for an InP/InGaAs hetero junction bipolar transistor(HBT). As a result, it is possible to eliminate the need for etching the InP layer 4 to remain thin and to form a surface protection film of a uniform thickness without increasing manufacturing processes. If the InGaAsP layer 5 is provided between the InP layer 4 which becomes an emitter layer and an InGaAs emitter cap layer 7, the InGaAsP layer 5 becomes an etching stopper layer, and it is possible to obtain small energy discontinuous levelΔEc at a conduction band side formed in InP/InGaAs interface and to reduce a resistance of InP/GaAs interface.
申请公布号 JPH11121462(A) 申请公布日期 1999.04.30
申请号 JP19970275854 申请日期 1997.10.08
申请人 FUJITSU LTD 发明人 SHIGEMATSU HISAO
分类号 H01L29/73;H01L21/331;H01L29/205;H01L29/737;(IPC1-7):H01L21/331 主分类号 H01L29/73
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