发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To prevent generation of thin horn-like burrs on the upper part of the side wall of a cylindrical cell when it is formed by the second polycrystalline silicon. SOLUTION: After an oxide film 9 is etched under the condition of CHF3 /O2 =90/4 sccm, 5 pa and 100 W using the resist pattern 10 shown in (a) in such a manner that a forward tapered cylindrical shape is formed as shown in (b), the first polycrystalline silicon 8 is anisotropically etched, the resist pattern 10 is removed and the second polycrystalline silicon film 11 is formed. Then, the polycrystalline silicon film 11 is etched back under the condition of 10 mTorr and source/bottom RF=400/70 W under which the side wall is strongly protected. Lastly, a cylindrical cell C is formed by the second polycrystalline silicon 11 by removing the oxide film 9 by wet etching under the condition of H2 O:HF=5:1 as shown in (d).
申请公布号 JPH11121709(A) 申请公布日期 1999.04.30
申请号 JP19970275840 申请日期 1997.10.08
申请人 MATSUSHITA ELECTRON CORP 发明人 UNO AKIHITO
分类号 H01L21/302;H01L21/3065;H01L21/8242;H01L27/108 主分类号 H01L21/302
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