发明名称 PATTERN FORMING METHOD AND PRODUCTION OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To enable a device to develop a fine pattern with an aq. alkali developer without swelling by irradiating a coating film consisting of a photosensitive comopsn. contg. a carboxylic acid structure with active chemical rays and changing the carboxylic acid structure in the irradiated part into aγ- orδ- lactone structure. SOLUTION: A coating film consisting of a photosensitive comopsn. contg. a carboxylic acid structure is formed on a substrate and irradiated with active chemical rays in a prescribed pattern drape to form a latent image. A reaction is progressed by heating the film and thereafter, the film is developed by using an aq. alkali developer so that a part or the whole of the carboxylic acid structure in the irradiated part is changed into aγ- orδ-lactone structure being a carboxylic ester structure. The carboxylic acid structure for forming theγ- orδ-lactone structure is preferably aγ- orδ-hydroxycarboxylic acid structure.
申请公布号 JPH11109627(A) 申请公布日期 1999.04.23
申请号 JP19980150928 申请日期 1998.06.01
申请人 HITACHI LTD 发明人 HATTORI KOJI;TSUCHIYA HIROKO;SHIRAISHI HIROSHI
分类号 G03F7/038;H01L21/027;(IPC1-7):G03F7/038 主分类号 G03F7/038
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