发明名称 |
MOVING STAGE EQUIPMENT AND SCANNING PROBE MICROSCOPE PROVIDED WITH THE MOVING STAGE EQUIPMENT |
摘要 |
<p>PROBLEM TO BE SOLVED: To make rigidity as high as possible, reduce height dimension, and decrease influence of rigidity of a driving part. SOLUTION: This equipment 12 includes a Z-axis stage 30 elevating vertically a specimen stand 13 installed in the upper part, and a horizontal stage constituted of an X-axis stage 10 and a Y-axis stage 20 which move the Z-axis stage 30 in the horizontal direction, and is fixed on a surface plate 11. In this case, the Z-axis stage 30 is slidably arranged on the surface plate. and linked with the horizontal stage by using a plate spring 36 which has high rigidity in the horizontal direction and low rigidity in the vertical direction.</p> |
申请公布号 |
JPH11108658(A) |
申请公布日期 |
1999.04.23 |
申请号 |
JP19970290325 |
申请日期 |
1997.10.07 |
申请人 |
HITACHI CONSTR MACH CO LTD |
发明人 |
SHIRAI TAKASHI;MURAYAMA TAKESHI;MORIMOTO TAKASHI;KURODA HIROSHI;ONOZATO AKIMASA |
分类号 |
G01B21/30;B23Q1/00;B23Q1/25;B23Q1/44;B23Q1/56;G01B7/34;G01N27/00;G01Q10/02;G01Q30/20;G01Q90/00;G12B5/00;H01J37/20;(IPC1-7):G01B21/30 |
主分类号 |
G01B21/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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