发明名称 MULTILAYERED CIRCUIT BOARD AND METHOD FOR INSPECTING THE SAME FOR INTERLAYER SHIFT IN POSITION
摘要 PROBLEM TO BE SOLVED: To easily specify the layer of a multilayered circuit board causing shift in position and, at the same time, to easily discriminate the size of the positional shift. SOLUTION: When a multilayered circuit board is composed of six layers, a projecting tolerance indicating pattern 11 and a position indicating pattern 12 are arranged on the second layer (reference layer) from one surface of the circuit board, and position indicating patterns 13-15 are arranged on the third to fifth layers from the surface so that the four patterns 12-15 may appear in the tolerance indicating pattern 11. Each layer of the multilayered circuit board is inspected for positional shift by discriminating whether or not the pattern on the layer is shifted from the pattern of the reference layer by irradiating the six layers with X rays.
申请公布号 JPH11112154(A) 申请公布日期 1999.04.23
申请号 JP19970272513 申请日期 1997.10.06
申请人 SHIN KOBE ELECTRIC MACH CO LTD 发明人 KANAI ATSUSHI;SHIMAZU AKIHIRO;YAMAGUCHI HIROAKI;TANIGUCHI ISAMU
分类号 G01R31/28;H05K1/02;H05K3/46;(IPC1-7):H05K3/46 主分类号 G01R31/28
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