发明名称 |
METHOD FOR OBTAINING CORRECTING INFORMATION IN LASER BEAM MACHINING AND METHOD FOR CORRECTING LASER IRRADIATING POSITION |
摘要 |
<p>PROBLEM TO BE SOLVED: To correctly and efficiently measure a hole opened in a testing substrate at the time of obtaining corrected information on a laser irradiating position. SOLUTION: In a method for successively measuring a position of a testing hole H machined by being irradiated with a laser beam and obtaining a deviation between a measuring position P and a setting position (p) as correcting information, a process which predicts the measuring position P of the testing hole H next measured based on a vector V reaching from the measuring position P of the testing hole H first measured to the measuring position P of the testing hole H later measured in a pair of adjacent testing holes H already measured and the measuring position P of the testing hole H measured just before, and a process which arranges a measuring zone 1 by a position measuring means in a zone including the predicted measuring position P and measures the position of the testing hole H next measured are included in the measuring process of the testing hole H.</p> |
申请公布号 |
JPH11104874(A) |
申请公布日期 |
1999.04.20 |
申请号 |
JP19970268487 |
申请日期 |
1997.10.01 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
NAKAI IZURU;KASAI KENJI;OKADA TOSHIHARU;TANAKA SATOSHI;NISHIKAWA YUKIO |
分类号 |
B23K26/00;B23K26/04;B23K26/38;H05K3/00;(IPC1-7):B23K26/04 |
主分类号 |
B23K26/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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