发明名称 Lens meter
摘要 A lens meter is provided which includes a light source portion (20) with a first light source (21) for generating a lens-characteristic measuring light beam (P2) and a second light source (23) for generating a position specifying light beam (P1). A patterning plate (28) with lens-characteristic measuring patterns (28c) and position specifying patterns (28b) is disposed in an optical path (31) of the lens-characteristic measuring light beam (P2) and position specifying light beam (P1) generated by the light source portion (20). The measuring light beam (P2) is projected onto a subject lens (30) set in the optical path (31) so that the images (28c') of the lens-characteristic measuring pattern (28c) are received. The received images (28c') are analyzed, and the lens-characteristic mapping display of the subject lens (30) is performed. In this lens meter, the first and second light sources (21, 23) are separate from each other.
申请公布号 US5896194(A) 申请公布日期 1999.04.20
申请号 US19970993312 申请日期 1997.12.18
申请人 KABUSHIKI KAISHA TOPCON 发明人 YANAGI, EIICHI;IKEZAWA, YUKIO
分类号 G01M11/02;(IPC1-7):G01B9/00 主分类号 G01M11/02
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