发明名称 TREATMENT OF SEMICONDUCTOR WAFER AND APPARATUS
摘要 <p>PROBLEM TO BE SOLVED: To produce a semiconductor wafer having little slip, defect, etc., of a crystal lattice. SOLUTION: This method for producing a semiconductor wafer comprises supporting a semiconductor wafer substrate W cut in a crystal face (100) from a semiconductor single crystal by a substrate-supporting table installed at a prescribed position in a heat treating space in a vertical or tilted state, and treating the supported substrate under a heated condition. The method also comprises a positioning step for fixing the portion corresponding to the crystal orientation <110> of the semiconductor wafer substrate, on the wafer outer periphery as a lower end-supporting position, and an installing step for installing the semiconductor wafer substrate W so that the lower end supporting position may be put downward together with a lower end-supporting part 7 formed at the lower part of the substrate-supporting table.</p>
申请公布号 JPH11106287(A) 申请公布日期 1999.04.20
申请号 JP19970286188 申请日期 1997.10.03
申请人 SUPER SILICON KENKYUSHO:KK 发明人 NAKAHARA SHINJI;IMAI MASATO;MAYUZUMI MASANORI;INOUE KAZUTOSHI
分类号 C30B25/12;H01L21/205;H01L21/22;H01L21/324;H01L21/68;H01L21/683;(IPC1-7):C30B25/12 主分类号 C30B25/12
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