| 摘要 |
A semiconductor device capable of giving glitch noise to a test signal used in a noise test for the device. The semiconductor device includes an input circuit for receiving either a test signal supplied from a device tester or a control signal, and an internal circuit connected to the input circuit by a signal line. The internal circuit operates based on a signal provided from the input circuit. The signal line is connected to a noise generator. The noise generator generates glitch noise in a test signal supplied from the tester. |
