STRUCTURE OF KNOWN GOOD DIE FOR BARE CHIP TEST,申请号KR19950015304-传众专利搜索

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发明名称	STRUCTURE OF KNOWN GOOD DIE FOR BARE CHIP TEST
摘要
申请公布号	KR0177274(B1)	申请公布日期	1999.04.15
申请号	KR19950015304	申请日期	1995.06.10
申请人	SIMM TECH CO.,LTD	发明人	JUN, SE-HO
分类号	H01L21/60	主分类号	H01L21/60
代理机构		代理人
主权项
地址

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