PATTERN GENERATOR IN SEMICONDUCTOR TEST SYSTEM,申请号KR19950025632-传众专利搜索

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发明名称	PATTERN GENERATOR IN SEMICONDUCTOR TEST SYSTEM
摘要
申请公布号	KR0182068(B1)	申请公布日期	1999.04.15
申请号	KR19950025632	申请日期	1995.08.21
申请人	ADVANTEST CORP.	发明人	HOUSAKO, TAKAHIRO;HASHIMOTO, JUN
分类号	G11C29/00;(IPC1-7):G11C29/00	主分类号	G11C29/00
代理机构		代理人
主权项
地址

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