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发明名称
ENHANCED TEST CIRCUIT
摘要
申请公布号
KR0165105(B1)
申请公布日期
1999.04.15
申请号
KR19890012886
申请日期
1989.09.06
申请人
TEXAS INSTRUMENTS INCORPORATED
发明人
WHETSEL, LEE D.,JR
分类号
G01R31/26;G01R31/28;G01R31/3185;G11C29/00;G11C29/02;G11C29/56;H01L21/66;H01L21/822;H01L27/04;(IPC1-7):G11C29/00
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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