发明名称 SCANNING TYPE PROBE MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To acquire correct measured information at all times by adjusting a position of a displacement sensor to project a light of a light-emitting element to a constant position of a cantilever with a constant angle of incidence. SOLUTION: A scanner 28 has a moving end which can move in three- dimensional directions upon application of an electric signal, and optically detects a displacement state of a cantilever 30 set at the moving end by displacement sensor. The displacement sensor has a light-emitting element 32 illuminating a predetermined light to the cantilever 30 and a light-detecting element 34 detecting a reflecting light, and is arranged in a sensor holder 44 having a built-in position adjustment mechanism. The position adjustment mechanism adjusts a position of the displacement sensor to illuminate the light of the light- emitting element 32 to a constant position of the cantilever 30 with a constant angle of incidence at all times during a movement of the moving end of the scanner 28. While a bend state of the cantilever 30 is maintained constant, a probe 40 of the cantilever 30 is scanned to trace a sample 48 in XY directions, thereby measuring a surface state of the sample 48. Accordingly correct measured information is obtained at all times.
申请公布号 JPH1194854(A) 申请公布日期 1999.04.09
申请号 JP19980178446 申请日期 1998.06.25
申请人 OLYMPUS OPTICAL CO LTD 发明人 HAYASHI YOSHIAKI;ITO SHUICHI
分类号 G01B11/00;G01B7/34;G01B21/30;G01N37/00;G01Q10/00;G01Q10/04;G01Q20/02;G01Q60/24;G01Q90/00;H01J37/28;(IPC1-7):G01N37/00 主分类号 G01B11/00
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