发明名称 X-RAY SOLID SURFACE DETECTOR AND X-RAY DIAGNOSTIC DEVICE
摘要 PROBLEM TO BE SOLVED: To effectively utilize gradation after A/D conversion by changing dynamic range of X-ray detector according to X-ray exposure condition, and improving image quality, in perspective view, of a part comprising such region as X-ray absorption is significantly different. SOLUTION: Based on the information inputted from a KB (keyboard) 23, an X-ray exposure condition selecting part 19 selects an X-ray exposure condition, and with the X-ray exposure condition, a corresponding table 17 is searched for reading such gain control state as matches exposure condition, thus an analogue SW setting part 15 is driven. Using the signal of the analogue SW setting part 15, integration capacities 49, 53, and 57 of a first stage Integration amplifier 47 are switched for gain control.
申请公布号 JPH1194532(A) 申请公布日期 1999.04.09
申请号 JP19970257311 申请日期 1997.09.22
申请人 TOSHIBA CORP 发明人 YAMADA SHINICHI;SAKAGUCHI TAKUYA;AOKI KUNIO;NISHIKI MASAYUKI
分类号 G01B15/04;A61B6/00;G01T1/24;H01L31/09;(IPC1-7):G01B15/04 主分类号 G01B15/04
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