发明名称 MASK AND EXPOSURE DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a mask which is used in a photolithography stage at the time of producing a semiconductor device or liquid crystal display device and substantially prevents the failure of the ends of the mask even if these masks receive impact. SOLUTION: Protective members 2 consisting of elastic materials are mounted at the angle parts at the four corners of the mask 1. The protective members 2 are so mounted at these parts that the recessed parts formed to profile the angular part shapes of the mask 1 are fitted onto the angle parts of the mask 1. The inside width TB of the protective members 2 is formed slightly narrower than the thickness TM of the glass substrate of the mask 1 so as not to be easily dislodged. The outside surfaces of the protective members 2 are formed to the shape nearly profiling the angle part shape of the mask 1. The outside surfaces of the protective members 2 have the prescribed height from the flanks of the glass substrate. Even if the mask 1 deviates and its angle parts collide against other members, the impact is absorbed by the protective members 2 and the failure of the mask 1 is averted.
申请公布号 JPH1195411(A) 申请公布日期 1999.04.09
申请号 JP19970269371 申请日期 1997.09.16
申请人 NIKON CORP 发明人 NARA KEI;HAMADA TOMOHIDE
分类号 G03F1/60;G03F7/20;H01L21/027 主分类号 G03F1/60
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