The invention relates to a device for testing electronic components comprising a stimulating device which galvanically contacts the component. Said stimulating device excites the component by means of electric application to generate a field in the surrounding space. In addition, a measuring device is provided which is galvanically separated from the component and arranged in the proximity of said component in order to measure the generated field. The invention is characterized in that the stimulating device is configured for applying a voltage to the component and the measuring device contains a measuring amplifier to measure the electric differential voltage between two electrodes. The electrodes are positioned on two points within the electric field generated by the component, whereby a first electrode is positioned in the proximity of said component.
申请公布号
DE19742055(A1)
申请公布日期
1999.04.08
申请号
DE19971042055
申请日期
1997.09.24
申请人
ITA INGENIEURBUERO FUER TESTAUFGABEN GMBH, 22769 HAMBURG, DE
发明人
BUKS, MANFRED, 24558 HENSTEDT-ULZBURG, DE;HOSSEINI, KARIM, 22299 HAMBURG, DE