发明名称 Verfahren zur Herstellung eines leitenden Kontakts auf einem Halbleiterkörper
摘要 A method of forming a capped and borderless contact of polysilicon on a body of a semiconductor material includes depositing a layer of undoped polysilicon on the surface of the body and forming an opening therethrough to the surface of the body. The side walls of the opening are then coated with a layer of silicon nitride and the opening is then filled with doped polysilicon which forms the contact. The doped and undoped polysilicon are heated in an oxidizing atmosphere to grow a layer of silicon dioxide thereon having a thicker portion over the doped polysilicon then over the undoped polysilicon. The silicon dioxide layer is etched to remove the thinner portion leaving the thicker portion over the doped polysilicon as a capping layer. The undoped polysilicon is then etched away and a layer of a dielectric material is deposited on the body and surrounding the doped polysilicon contact. <IMAGE>
申请公布号 DE69322024(T2) 申请公布日期 1999.04.08
申请号 DE1993622024T 申请日期 1993.08.04
申请人 SIEMENS AG, 80333 MUENCHEN, DE 发明人 ROEHL, SIEGFRIED, DR., D-82054 SAUERLACH, DE
分类号 H01L21/28;H01L21/316;H01L21/60;H01L21/768;H01L23/532;(IPC1-7):H01L21/28 主分类号 H01L21/28
代理机构 代理人
主权项
地址