发明名称 Potential difference transmission device and semiconductor memory device using the same
摘要 A semiconductor memory device 200 includes: a memory cell array 101 including a plurality of pairs of bit lines (BL, XBL), a plurality of word lines WL and a plurality of memory cells 100; a decoder 104 for decoding address information to activate one of the plurality of word lines WL in accordance with the address information; precharge circuits 105 for setting each of the plurality of pair of bit lines (BL, XBL) to a predetermined precharge potential; sense amplifiers 110; and potential difference transmission circuits 109 provided between the memory cell array 101 and the sense amplifiers 110. The potential difference transmission circuits 109 hold a potential difference Vd0 between respective pair of bit lines among the plurality of pairs of bit lines (BL, XBL) and transmit the held potential difference Vd0 between the pair of bit lines to a respective sense amplifier 110. The sense amplifier 110 amplifies the potential difference Vd0 between the pair of bit lines transmitted by the potential difference transmission circuit 109 so as to output the data stored in a corresponding memory cell.
申请公布号 US5892723(A) 申请公布日期 1999.04.06
申请号 US19970837207 申请日期 1997.04.14
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 TANAKA, ISAO;HATSUDA, TSUGUYASU
分类号 G11C7/06;G11C27/02;(IPC1-7):G11C13/00 主分类号 G11C7/06
代理机构 代理人
主权项
地址