发明名称 Plasma enhanced CVD apparatus and process, and dry etching apparatus and process
摘要 A plasma enhanced CVD apparatus includes a processing chamber, a pumping system for evacuating the processing chamber, a gas inlet system for introducing a source gas, and a plasma generating electrode provided in the processing chamber for depositing a film on a substrate in the processing chamber by plasma generated by electrical power supplied to the plasma generating electrode; the plasma generating electrode has two terminals, one of the terminals is connected to a radio frequency power source and other of the terminals is grounded through an electrode potential controlling system; and the processing chamber is grounded through an inner wall potential controlling system. The present invention is further directed to a plasma enhanced CVD process, a dry etching apparatus, and a dry etch process.
申请公布号 US5891349(A) 申请公布日期 1999.04.06
申请号 US19960720868 申请日期 1996.10.03
申请人 ANELVA CORPORATION 发明人 TOBE, RYOKI;SASAKI, MASAO;SEKIGUCHI, ATSUSHI;TAKAGI, KEN-ICHI
分类号 C23C16/50;C23C16/509;C23F4/00;H01J37/32;H01L21/285;H01L21/302;H01L21/3065;H05H1/46;(IPC1-7):H05H1/00 主分类号 C23C16/50
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